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171.
离子束加工误差对散射损失的影响研究 总被引:1,自引:0,他引:1
离子束加工(Ion Beam Figuring,IBF)去除函数对加工残差具有重要的影响,而加工残差引起的表面散射则导致光学性能发生变化.为了减小加工残差对光学性能的影响,利用基于CCOS成形原理的离子束加工仿真程序对光学镜面进行修形,分析不同去除函数宽度对散射损失(Ratio of Scattering Loss,RSL)指标的影响.通过研究可知,随着去除函数宽度的减小,加工残差对散射损失的影响越来越小.因此,根据加工残差对RSL指标的影响程度以及RSL指标要求,可以合理选择去除函数宽度,从而在满足面形精度的同时,优化加工工艺. 相似文献
172.
The signature of a system with independent and identically distributed (i.i.d.) component lifetimes is a vector whose ith element is the probability that the ith component failure is fatal to the system. System signatures have been found to be quite useful tools in the study and comparison of engineered systems. In this article, the theory of system signatures is extended to versions of signatures applicable in dynamic reliability settings. It is shown that, when a working used system is inspected at time t and it is noted that precisely k failures have occurred, the vector s [0,1]n‐k whose jth element is the probability that the (k + j)th component failure is fatal to the system, for j = 1,2,2026;,n ‐ k, is a distribution‐free measure of the design of the residual system. Next, known representation and preservation theorems for system signatures are generalized to dynamic versions. Two additional applications of dynamic signatures are studied in detail. The well‐known “new better than used” (NBU) property of aging systems is extended to a uniform (UNBU) version, which compares systems when new and when used, conditional on the known number of failures. Sufficient conditions are given for a system to have the UNBU property. The application of dynamic signatures to the engineering practice of “burn‐in” is also treated. Specifically, we consider the comparison of new systems with working used systems burned‐in to a given ordered component failure time. In a reliability economics framework, we illustrate how one might compare a new system to one successfully burned‐in to the kth component failure, and we identify circumstances in which burn‐in is inferior (or is superior) to the fielding of a new system. © 2009 Wiley Periodicals, Inc. Naval Research Logistics, 2009 相似文献
173.